Transversal mode and thermal analysis of an InP laser diode by near-field scanning probe microscopies
Identifieur interne : 005B45 ( Main/Repository ); précédent : 005B44; suivant : 005B46Transversal mode and thermal analysis of an InP laser diode by near-field scanning probe microscopies
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<author><name sortKey="Lacroute, Yvon" uniqKey="Lacroute Y">Yvon Lacroute</name>
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<term>Semiconducteur III-V</term>
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